Reliability Report:

Metal: Al / 0.5% Cu / 0.8% Si. Passivation: Summary Data with Chi-Square Distribution Assumed. Stress Ambient Temperature and Voltage to. Field Ambient ...
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Reliability Report: Process: Metal:

DS1921

Single Poly, Double Metal (Ti/TiN layers used on all Metals)

Gate Ox Thickness:

Al / 0.5% Cu / 0.8% Si

Cf: Ea: β:

Summary Data with Chi-Square Distribution Assumed. Stress Ambient Temperature and Voltage to Field Ambient Temperature And Voltage

DESCRIPTION

VEHICLE

REV DATE CODE

0.6 µm 150 Å

Tuse: Vuse:

60% 0.7 1

Standard Process

25

°C

5.5

Volts

Pin Count:

8

Passivation: Assembly: Package: Body Size:

CONDITION

READPOINT

125C, 6.0 VOLTS 125C, 6.0 VOLTS 125C, 6.0 VOLTS

48 336 1000

TEOS Oxide / Nitride ATP (Amkor, PI) PDIP 300

QUANTITY

FAILS FILE # DEVICE HRS

HIGH TEMPERATURE OPERATING LIFE HIGH VOLTAGE LIFE

DS1921 DS1921 DS1921

A6 A6 A6

0043 0043 0043

FAILURE RATE

DEVICE HRS: MTBF (yrs):

HOURS HOURS HOURS

225 80 79

TOTALS: FITs:

1.34E+08 7575

0 0 1 26953

1 15

TEMPERATURE HUMIDITY BIAS BIASED MOISTURE

DS1921

A5

0024

85/85, 5.5 VOLTS

274

HOURS

BIASED MOISTURE

DS1921

A6

0043

85/85, 5.5 VOLTS

274

HOURS

30

TOTALS:

0

0

TEMPERATURE CYCLE TEMP CYCLE

DS1921

A5

0024

-40 TO 85C

300

CYCLE

TEMP CYCLE

DS1921

A6

0043

-40 TO 85C

300

CYCLE

30

TOTALS:

0

0

STORAGE LIFE STORAGE LIFE STORAGE LIFE

Friday, February 01, 2002

DS1921 DS1921

A5 A6

0024 0043

85C 85C

336

HOURS

336

HOURS

30

0

16794212 35827652 81570110

Reliability Report: Process: Metal:

DS1921

Single Poly, Double Metal (Ti/TiN layers used on all Metals)

Gate Ox Thickness:

Al / 0.5% Cu / 0.8% Si

Cf: Ea: β:

Summary Data with Chi-Square Distribution Assumed. Stress Ambient Temperature and Voltage to Field Ambient Temperature And Voltage

VEHICLE

DESCRIPTION

0.6 µm

REV DATE CODE

Standard Process

150 Å

Tuse: Vuse:

60% 0.7 1

25

°C

5.5

Volts

Pin Count:

CONDITION

8

Passivation: Assembly: Package: Body Size:

READPOINT

TEOS Oxide / Nitride ATP (Amkor, PI) PDIP 300

QUANTITY TOTALS:

FILE # FAILURE MODE 26953

FAILURE MECHANISM

FAIL_DLOG_MISREAD

UNKNOWN

PRODUCT

REV

DIE SIZE (x)

DIE SIZE (y)

No. of Transistors

DS1921

A6

174

140

82000

Friday, February 01, 2002

FAILS FILE # DEVICE HRS 0