BUZ 271 - Datasheet catalog

Semiconductor Group. 1. 07/96. BUZ 271. SIPMOS ® Power Transistor. • P channel. • Enhancement mode. • Avalanche rated. Pin 1. Pin 2. Pin 3. G. D. S. Type.
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BUZ 271

SIPMOS ® Power Transistor

• P channel • Enhancement mode • Avalanche rated

Pin 1

Pin 2

G

Pin 3

D

S

Type

VDS

ID

RDS(on)

Package

Ordering Code

BUZ 271

-50 V

-22 A

0.15 Ω

TO-220 AB

C67078-S1453-A2

Maximum Ratings Parameter

Symbol

Continuous drain current

ID

TC = 26 °C

Values

Unit A

-22

IDpuls

Pulsed drain current

TC = 25 °C

-88

EAS

Avalanche energy, single pulse

mJ

ID = -22 A, VDD = -25 V, RGS = 25 Ω L = 413 µH, Tj = 25 °C

200

Gate source voltage

VGS

Power dissipation

Ptot

TC = 25 °C

± 20

V W

125

Operating temperature

Tj

-55 ... + 150

Storage temperature

Tstg

-55 ... + 150

Thermal resistance, chip case

RthJC

≤1

Thermal resistance, chip to ambient

RthJA

≤ 75

DIN humidity category, DIN 40 040

K/W

E

IEC climatic category, DIN IEC 68-1

Semiconductor Group

°C

55 / 150 / 56

1

07/96

BUZ 271

Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter

Symbol

Values min.

typ.

Unit max.

Static Characteristics Drain- source breakdown voltage

V(BR)DSS

VGS = 0 V, ID = -0.25 mA, Tj = 25 °C Gate threshold voltage

-50

-

-

-2.1

-3

-4

VGS(th)

VGS=VDS, ID = 1 mA Zero gate voltage drain current

V

IDSS

µA

VDS = -50 V, VGS = 0 V, Tj = 25 °C

-

-0.1

-1

VDS = -50 V, VGS = 0 V, Tj = 125 °C

-

-10

-100

Gate-source leakage current

IGSS

VGS = -20 V, VDS = 0 V Drain-Source on-resistance

-

-10

-100 Ω

RDS(on)

VGS = -10 V, ID = -14 A

Semiconductor Group

nA

-

2

0.12

0.15

07/96

BUZ 271

Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter

Symbol

Values min.

typ.

Unit max.

Dynamic Characteristics Transconductance

gfs

VDS≥ 2 * ID * RDS(on)max, ID = -14 A Input capacitance

1.5

pF -

2000

2700

-

650

975

-

250

375

Crss

VGS = 0 V, VDS = -25 V, f = 1 MHz Turn-on delay time

-

Coss

VGS = 0 V, VDS = -25 V, f = 1 MHz Reverse transfer capacitance

4

Ciss

VGS = 0 V, VDS = -25 V, f = 1 MHz Output capacitance

S

td(on)

ns

VDD = -30 V, VGS = -10 V, ID = -2.95 A RGS = 50 Ω Rise time

-

30

45

-

120

180

-

130

175

-

140

190

tr

VDD = -30 V, VGS = -10 V, ID = -2.95 A RGS = 50 Ω Turn-off delay time

td(off)

VDD = -30 V, VGS = -10 V, ID = -2.95 A RGS = 50 Ω Fall time

tf

VDD = -30 V, VGS = -10 V, ID = -2.95 A RGS = 50 Ω

Semiconductor Group

3

07/96

BUZ 271

Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter

Symbol

Values min.

typ.

Unit max.

Reverse Diode Inverse diode continuous forward current IS TC = 25 °C Inverse diode direct current,pulsed

-

-

-88 V

-1.25

-1.7

trr

ns -

90

-

Qrr

VR = -30 V, IF=lS, diF/dt = 100 A/µs

Semiconductor Group

-22

-

VR = -30 V, IF=lS, diF/dt = 100 A/µs Reverse recovery charge

-

VSD

VGS = 0 V, IF = -44 A Reverse recovery time

-

ISM

TC = 25 °C Inverse diode forward voltage

A

µC -

4

0.23

-

07/96

BUZ 271

Power dissipation Ptot = ƒ(TC)

Drain current ID = ƒ(TC) parameter: VGS ≥ -10 V

130

-24

W

A

110

Ptot

-20

ID

100 90

-18 -16

80 -14 70 -12 60 -10

50

-8

40

-6

30 20

-4

10

-2

0 0

0 20

40

60

80

100

120

°C

160

0

20

40

60

80

100

120

TC

°C

160

TC

Safe operating area ID = ƒ(VDS) parameter: D = 0.01, TC = 25°C

Transient thermal impedance Zth JC = ƒ(tp) parameter: D = tp / T 10 1

-10 3

K/W A

ID

ZthJC

10 0

t = 35.0µs p

-10 2

100 µs

/ID = -10

VD

10 -1

1 ms

S

D = 0.50 0.20

) on S( RD

1

0.10 10 ms

0.05

10 -2

0.02 0.01 DC single pulse -10

0

-10

0

-10

1

V -10

10

2

10

VDS

Semiconductor Group

-3 -7

10

-6

10

-5

10

-4

10

-3

10

-2

10

-1

s 10

tp

5

07/96

0

BUZ 271

Typ. output characteristics ID = ƒ(VDS)

Typ. drain-source on-resistance RDS (on) = ƒ(ID) parameter: VGS

parameter: tp = 80 µs -50

0.45

Ptot = 125W l

A

a b c

d

e

f

g

h

i

Ω VGS [V]

ID

-40 -35 -30 -25 k

-20

a

-4.0

b

-4.5

c

-5.0

d

-5.5

e

-6.0

f

-6.5

g

-7.0

h

-7.5

i

-8.0

j j

-9.0

k

-10.0

l

-20.0

-15 i

RDS (on)0.35 0.30 0.25 0.20 0.15 0.10

h

-10

j

g f e

-5

0.05

d

c b a

0 0

-2

-4

-6

-8

V

0.00 0

-12

VGS [V] = a b c d e f -4.0 -5.5 -6.0 -6.5 -7.0 -7.5 -4.5 -5.0

-4

-8

g h i j -8.0 -9.0 -10.0 -20.0

-12

-16

VDS

A

Typ. transfer characteristics ID = f (VGS)

Typ. forward transconductance gfs = f (ID)

parameter: tp = 80 µs VDS≥2 x ID x RDS(on)max

parameter: tp = 80 µs, VDS≥2 x ID x RDS(on)max

-24

6.0

A

S

-20

ID

5.0

gfs

-18

4.5

-16

4.0

-14

3.5

-12

3.0

-10

2.5

-8

2.0

-6

1.5

-4

1.0

-2

0.5

0 0

-24

ID

0.0 -1

-2

-3

-4

-5

-6

-7

-8

V

-10

VGS

Semiconductor Group

6

0

-4

-8

-12

-16

A ID

07/96

-22

BUZ 271

Drain-source on-resistance RDS (on) = ƒ(Tj ) parameter: ID = -14 A, VGS = -10 V

Gate threshold voltage VGS (th) = ƒ(Tj) parameter: VGS = VDS, ID = 1 mA

0.36

-4.6 V



98%

-4.0

RDS (on) 0.28

VGS(th)

-3.6

typ

-3.2

0.24

-2.8 0.20 0.16

98%

-2.4

typ

-2.0

2%

-1.6

0.12

-1.2 0.08 -0.8 0.04

-0.4

0.00 -60

-20

20

60

100

°C

0.0 -60

160

-20

20

60

100

Tj

°C

160

Tj

Typ. capacitances

Forward characteristics of reverse diode IF = ƒ(VSD) parameter: Tj , tp = 80 µs

C = f (VDS) parameter:VGS = 0V, f = 1MHz 10 1

-10 2

nF

A

C

IF

Ciss 10 0

-10 1

Coss

Crss 10 -1

-10 0

Tj = 25 °C typ Tj = 150 °C typ Tj = 25 °C (98%) Tj = 150 °C (98%) 10 -2 0

-5

-10

Semiconductor Group

-15

-20

-25

-30

V VDS

-40

-10 -1 0.0

-0.4

-0.8

-1.2

-1.6

-2.0

-2.4

V

VSD

7

07/96

-3.0

BUZ 271

Avalanche energy EAS = ƒ(Tj ) parameter: ID = -22 A, VDD = -25 V RGS = 25 Ω, L = 413 µH

Drain-source breakdown voltage V(BR)DSS = ƒ(Tj)

220

-60 V

mJ

EAS

180

V(BR)DSS-57 -56

160

-55

140

-54 120

-53

100

-52 -51

80

-50

60

-49

40

-48 -47

20 0 20

40

60

80

100

120

°C

160

Tj

Semiconductor Group

-46 -45 -60

-20

20

60

100

°C

Tj

8

07/96

160

BUZ 271

Package Outlines TO-220 AB Dimension in mm

Semiconductor Group

9

07/96

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