Decapsulation of Silver-Alloy-Wire-Bonded Devices

Ag. 90%. Au. 10%. • Lower percentage of Ag. • All wires oxidized, but none broken. • Cracks on the ball. • Passivation damaged. 4. Laser + plasma 50W.
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Decapsulation of Silver-Alloy-Wire-Bonded Devices ESREF Arcachon, France September 30th-October 4th, 2013 François KERISIT (DC, CRISMAT-LaMIPS)

Silver wire-bonding • Ag and Au show less impact on the bond pad than Cu • Ag has slightly higher electrical and thermal conductivies • Ag is cheaper than Au (60x) Units

Ag

Au

Cu

W/mK

430

320

400

10-8 Ωm

1.63

2.2

1.72

Young’s Modulus

GPa

83

78

130

Vickers hardness

MPa

251

216

369

Thermal Conductivity Electrical Resistivity

[1] Pagba A. et al., Cu wire and beyond - Ag wire an alternative to Cu?, 2010, 12th EPTC [2] Kai L.J. et al., Silver Alloy Wire Bonding, 2012, ECTC 1

Case study #1 4 Ag alloy wire-bonded samples Wire

1. 2. 3. 4.

Diameter

18 µm

Ag

95%

Au

0.5%

Pd

4.5%

Laser only Laser + acids Laser + plasma 100 W Laser + plasma 50 W

Acid N:S

2:1

Temperature

10°C

Etch time

120 s

Plasma CF4

40%

O2

60%

Power

Variable

Temperature

80°C

Pressure

4000 mTorr

Cycle time

10 min

Filler blast

CO2 2

1. Laser only

3. Laser + plasma 100 W

2. Laser + acids

4. Laser + plasma 50 W 3

Wet chemistry • Same issue as copper wires, silver is attacked by both nitric and sulfuric acids

Case study #2 Wire Diameter

15 µm

Ag

90%

Au

10%

Laser + plasma 50W

• • • •

Lower percentage of Ag All wires oxidized, but none broken Cracks on the ball Passivation damaged

4