OptiMOS™3 Power-Transistor - Infineon Technologies

21 mai 2013 - Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon ...
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BSC093N04LS G

OptiMOS™3 Power-Transistor

Product Summary

Features

VDS

40

V

• Fast switching MOSFET for SMPS

RDS(on),max

9.3

mW

• Optimized technology for DC/DC converters

ID

49

A

• Qualified according to JEDEC1) for target applications

PG-TDSON-8

• N-channel; Logic level • Excellent gate charge x R DS(on) product (FOM) • Very low on-resistance R DS(on) • Superior thermal resistance • 100% Avalanche tested • Pb-free plating; RoHS compliant • Halogen-free according to IEC61249-2-21 Type

Package

Marking

BSC093N04LS G

PG-TDSON-8

093N04LS

Maximum ratings, at T j=25 °C, unless otherwise specified Parameter

Symbol Conditions

Continuous drain current

ID

Value

V GS=10 V, T C=25 °C

49

V GS=10 V, T C=100 °C

31

V GS=4.5 V, T C=25 °C

40

V GS=4.5 V, T C=100 °C

26

V GS=10 V, T A=25 °C, R thJA=50 K/W 2)

13

Unit A

Pulsed drain current3)

I D,pulse

T C=25 °C

196

Avalanche current, single pulse4)

I AS

T C=25 °C

40

Avalanche energy, single pulse

E AS

I D=40 A, R GS=25 W

10

mJ

Gate source voltage

V GS

±20

V

1)

J-STD20 and JESD22

Rev. 2.1

page 1

2013-05-21

BSC093N04LS G Maximum ratings, at T j=25 °C, unless otherwise specified Parameter

Symbol Conditions

Power dissipation

P tot

Value

T C=25 °C

35

T A=25 °C,

T j, T stg

-55 ... 150

IEC climatic category; DIN IEC 68-1 Parameter

W

2.5

R thJA=50 K/W 2) Operating and storage temperature

Unit

°C

55/150/56 Values

Symbol Conditions

Unit

min.

typ.

max.

-

-

3.6

Thermal characteristics Thermal resistance, junction - case

R thJC

bottom top

Device on PCB

R thJA

6 cm2 cooling area2)

K/W

20 -

-

50

Electrical characteristics, at T j=25 °C, unless otherwise specified Static characteristics Drain-source breakdown voltage

V (BR)DSS V GS=0 V, I D=1 mA

40

-

-

Gate threshold voltage

V GS(th)

V DS=V GS, I D=14 µA

1.2

-

2

Zero gate voltage drain current

I DSS

V DS=40 V, V GS=0 V, T j=25 °C

-

0.1

1

V DS=40 V, V GS=0 V, T j=125 °C

-

10

100

V

µA

Gate-source leakage current

I GSS

V GS=20 V, V DS=0 V

-

10

100

nA

Drain-source on-state resistance

R DS(on)

V GS=4.5 V, I D=20 A

-

11.0

13.7

mW

V GS=10 V, I D=40 A

-

7.8

9.3

-

1

-

W

34

67

-

S

Gate resistance

RG

Transconductance

g fs

|V DS|>2|I D|R DS(on)max, I D=40 A

2)

Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain connection. PCB is vertical in still air. 3) See figure 3 for more detailed information 4)

See figure 13 for more detailed information

Rev. 2.1

page 2

2013-05-21

BSC093N04LS G Parameter

Values

Symbol Conditions

Unit

min.

typ.

max.

-

1400

1900

-

340

450

Dynamic characteristics Input capacitance

C iss V GS=0 V, V DS=20 V, f =1 MHz

Output capacitance

C oss

Reverse transfer capacitance

Crss

-

16

-

Turn-on delay time

t d(on)

-

3.6

-

Rise time

tr

-

2.4

-

Turn-off delay time

t d(off)

-

16

-

Fall time

tf

-

2.8

-

Gate to source charge

Q gs

-

4.9

-

Gate charge at threshold

Q g(th)

-

2.3

-

Gate to drain charge

Q gd

-

2.0

-

Switching charge

Q sw

-

4.6

-

Gate charge total

Qg

-

18

24

Gate plateau voltage

V plateau

-

3.5

-

Gate charge total

Qg

V DD=20 V, I D=30 A, V GS=0 to 4.5 V

-

8.6

11.4

Gate charge total, sync. FET

Q g(sync)

V DS=0.1 V, V GS=0 to 10 V

-

17

-

Output charge

Q oss

V DD=20 V, V GS=0 V

-

13

-

-

-

29

-

-

196

V DD=20 V, V GS=10 V, I D=30 A, R G,ext=1.6 W

pF

ns

Gate Charge Characteristics5)

V DD=20 V, I D=30 A, V GS=0 to 10 V

nC

V nC

Reverse Diode Diode continuous forward current

IS

Diode pulse current

I S,pulse

Diode forward voltage

V SD

V GS=0 V, I F=40 A, T j=25 °C

-

0.9

1.2

Reverse recovery charge

Q rr

V R=20 V, I F=I S, di F/dt =400 A/µs

-

15

-

5)

A

T C=25 °C

V

nC

See figure 16 for gate charge parameter definition

Rev. 2.1

page 3

2013-05-21

BSC093N04LS G 1 Power dissipation

2 Drain current

P tot=f(T C)

I D=f(T C); V GS≥10 V

40

50

35 40 30

30

ID [A]

Ptot [W]

25

20

20

15

10 10 5

0

0 0

40

80

120

160

0

40

80

TC [°C]

120

160

TC [°C]

3 Safe operating area

4 Max. transient thermal impedance

I D=f(V DS); T C=25 °C; D =0

Z thJC=f(t p)

parameter: t p

parameter: D =t p/T

103

10 limited by on-state resistance

1 µs 0.5

102

10 µs

1

0.2

ZthJC [K/W]

ID [A]

100 µs DC

101

0.1 0.05 0.02

1 ms 0.01

0.1 10 ms

single pulse

100

10-1

0.01 10-1

100

101

102

VDS [V]

Rev. 2.1

0

0

0

0

0

0

1

10-6

10-5

10-4

10-3

10-2

10-1

100

tp [s]

page 4

2013-05-21

BSC093N04LS G 5 Typ. output characteristics

6 Typ. drain-source on resistance

I D=f(V DS); T j=25 °C

R DS(on)=f(I D); T j=25 °C

parameter: V GS

parameter: V GS 20

120

3.5 V 5V 4.5 V

100

10 V

16 4V

RDS(on) [mW]

80

ID [A]

4V

60

12

4.5 V 5V 10 V

8

40 3.5 V

4

20 3.2 V 3V 2.8 V

0

0 0

1

2

0

3

10

20

VDS [V]

30

40

50

ID [A]

7 Typ. transfer characteristics

8 Typ. forward transconductance

I D=f(V GS); |V DS|>2|I D|R DS(on)max

g fs=f(I D); T j=25 °C

120

120

100

100

80

80

gfs [S]

ID [A]

parameter: T j

60

40

40

20

20 150 °C

25 °C

0

0 0

1

2

3

4

5

VGS [V]

Rev. 2.1

60

0

40

80

120

160

ID [A]

page 5

2013-05-21

BSC093N04LS G 9 Drain-source on-state resistance

10 Typ. gate threshold voltage

R DS(on)=f(T j); I D=40 A; V GS=10 V

V GS(th)=f(T j); V GS=V DS; I D=14 µA

16

2.5

2

98 %

8

1.5

VGS(th) [V]

RDS(on) [mW]

12

typ

1

4 0.5

0

0 -60

-20

20

60

100

140

180

-60

-20

20

Tj [°C]

60

100

140

180

Tj [°C]

11 Typ. capacitances

12 Forward characteristics of reverse diode

C =f(V DS); V GS=0 V; f =1 MHz

I F=f(V SD) parameter: T j

104

1000

Ciss

103

Coss

150 °C, 98%

100

IF [A]

C [pF]

25 °C

102

150 °C 25 °C, 98%

Crss

10

101

100

1 0

10

20

30

40

VDS [V]

Rev. 2.1

0.0

0.5

1.0

1.5

2.0

VSD [V]

page 6

2013-05-21

BSC093N04LS G 13 Avalanche characteristics

14 Typ. gate charge

I AS=f(t AV); R GS=25 W

V GS=f(Q gate); I D=30 A pulsed

parameter: T j(start)

parameter: V DD

100

12

20 V

10

8V 32 V

8

VGS [V]

IAV [A]

25 °C 100 °C

10

125 °C

6

4

2

1

0 0.1

1

10

100

1000

0

4

tAV [µs]

8

12

16

20

Qgate [nC]

15 Drain-source breakdown voltage

16 Gate charge waveforms

V BR(DSS)=f(T j); I D=1 mA

45

V GS Qg

VBR(DSS) [V]

40

35

V gs(th)

30

25

Q g(th)

Q sw Q gs

20 -60

-20

20

60

100

140

Q gate

Q gd

180

Tj [°C]

Rev. 2.1

page 7

2013-05-21

BSC093N04LS G Package Outline

PG-TDSON-8

PG-TDSON-8: Outline

Footprint

Rev. 2.1

page 8

2013-05-21

BSC093N04LS G Package Outline PG-TDSON-8: Tape

Dimensions in mm

Rev. 2.1

page 9

2013-05-21

BSC093N04LS G Published by Infineon Technologies AG 81726 Munich, Germany © 2009 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office

(www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.

Rev. 2.1

page 10

2013-05-21