AGENDA -Why open a component? - 4 ways of decapsulation - ACID - LASER - PLASMA/PLASER - MECHANICAL - Mix of techniques - New 2D Challenges - 3D Challenges
• +10°C
for 270s
No observable attack or corrosion on the lead finger coating or die pads, wires very uniform with a measured diameter of ~19.5mm and no evidence of thinning or pitting.
ACID Drop technique or automated decapsulator Positive or Negative pressure Nitric acid (HNO3) up to 90°C Sulfuric acid (H2SO4) up to 255°C Acid mix up to 100°C
AGENDA - Why open a component? - 4 ways of decapsulation - ACID - LASER - PLASMA/PLASER - MECHANICAL - Mix of techniques - New 2D Challenges - 3D Challenges
LASER ABLATION Regular LASER access today: 1. Generate a cavity (pocket) in EMC (100µm to 200µm remaining EMC above chip). 2. Opening is finished with a final acid touch (wet) or with plasma (dry).
LASER 1064 nm
PICTURE SUPERIMPOSITION
jpeg PICTURE
LASER ABLATION : Examples
AGENDA - Why open a component? - 4 ways of decapsulation - ACID - LASER
- PLASMA/PLASER - MECHANICAL - Mix of techniques - New 2D Challenges - 3D Challenges
PLASMA / PLASER
SESAME Technology incorporates Mutual Patents / IP developed by CNES, DIGIT CONCEPT SA and BSET EQ (WO2008/090281)
A : LASER Ablation • • • • •
STEP STEP STEP STEP STEP
1 2 3 4 5
: : : : :
Place your component on XY table Importation of an X-ray or CSAM image Adjust X and Y with the Table Choose your recipe Start LASER Ablation
B : LASER/Plasma Ablation • • •
Decrease of power LASER Increase of power PLASMA The hard coating is removed
C : Plasma O2/CF4 •
Removing of organic material with O2/CF4 plasma or pure O2
•
Approximately 15mn
CONFIDENTIAL
D : FilerBlast •
Removing of inorganic material with CO2 Liquid
•
Approximately 2 seconds
Step C & D repeats Plasma for 15mn Blast 2 seconds
BCB/Cu technology:
Goal: Reach circuitry without degradation (BCB dielectric , Cu lines). Methodology: 1. LASER cavity. 2. Dry chemical (PLASMA) opening. Benefits: No degradation due acid use.
LAT STM TOURS
AGENDA - Why open a component? - 4 ways of decapsulation - ACID - LASER - PLASMA/PLASER - MECHANICAL - Mix of techniques - New 2D Challenges - 3D Challenges
Needed : - Z force Feedback - Measurement of warpage - Collimator for tilt - Live video for human control
Mecanical : Polishing Polishing machine equipped with a collimator
Pictures property : DIGIT CONCEPT
AGENDA - Why open a component? - 4 ways of decapsulation - ACID - LASER - PLASMA/PLASER - MECHANICAL - Mix of techniques
- New 2D Challenges - 3D Challenges
Cu WIRES with BCB passivation LASER and ACID : 90% Fuming HNO3 / H2SO4 20%SO3 mix 5/1 @
+10°C
LASER / Acid … Goal: Reach both dies without separating them, without damage on Cu wires and without acid leak. Methodology: 1. LASER cavity. 2. Wet chemical opening at low temperature. Benefits: Safe, fast, repeatable. Allow low temp wet chemical opening in a reasonable time. Decrease acid consumption. No acid leak.
LASER / Acid … Goal: Balls and stitch access without revealing all top die surface. Methodology: 1. EMC removal from the side with LASER. 2. Acid final touch to reveal balls and stitch. Benefits: Top die were nearly not revealed. LASER preparation allowed an accurate positioning of the chemical etch.
LASER / Plasma / Acid … LASER decapsulation: Plastic ablation down to passive die backside (Si).
Wet chemical (HNO3) underfill etching down to active die.
Plasma etching (Ar then SF6): Silicon etching down to passive die backside.
Wet & dry etching, down to underfill.
Xrays analysis, zoom on active die: No visible damage on 1st and 2nd interconnects.
Preparation for MAGNETIC/THERMAL Goal: Remove nearly all EMC above or below the chip (front side or backside). Around 100µm remaining EMC thickness allows better result for SQUID or for thermograph investigations. Benefits: Safe, fast, repeatable. Very useful when chips are not chemical compatible.
AGENDA
-Questions … Please help me … I need 3D IC samples for my thesis. Michael and I are waiting for you ! Thanks
A lot of potential test moments: pre-, mid-, and post-bond testing ... 'Testing 3D Chips Containing Through-Silicon Vias', IEEE International Test Conference ... Paul Mooney3, Eric Pradel2, Dan Rishavy1, Don Robinson1, Yoichi Shimizu4.
Material's resistivity. Equivalent contact resistance. Each resistance is function of true contact area (in term of contact radius). Contact area's radius. Electrical to ...
that was developed for use in application-specific and custom-specific integrated circuits. Its simple, elegant, and ..... (See the DP83950 Data Sheet, published by National ...... In practice, fifteen different conditions may be used: these are list
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menu and select "Restore Module Config-New ECU". ... Input the PCM engineering number, enter the first (4) digits then select the box at the end of the.
Oct 6, 2010 - Introduction / Eufanet (Philippe Perdu). What is Eufanet and ... 3D (360degree) failure characterization in semiconductor devices using Hitachi's.
The defined modem strings(AT commands and answers) at chip.ini will pe printed at ...... This function opens and starts periodic ICMP echo request (ping) to a given remote host ...... The Web server of the IPC@CHIP uses an internal CGI table.
q TCP/IP API examples. - FTP client. - HTTP client. - Other TCP/IP examples ...... By default, the usage of a modem online control is disabled. Related Topics.
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occur in a particular installation. If this equipment does cause harmful interference to radio or television reception, which can be ... to which the receiver is connected. â Consult the dealer or an experienced radio/TV technician for help ... noc
television reception, which can be determined by turning the equipment off and on, the user ... Consult the dealer or an experienced radio/TV technician for help.
To describe a comprehensive overview of fault site localization technique by imaging with Nanoprobes. Resistive Contrast Imaging (RCI). Voltage DIstribution ...
FIB Micro-pillar sampling of Si devices and its 3D observation. T. Yaguchi, T. ... Introduction. New materials such as electronic and semiconductor devices.
TDA9361 : TV signal processor - Teletext decoder with embedded µ-Controller. TDA9381 : TV ... Linear RGB or YUV input with fast blanking for external RGB/YUV sources. .... ADC 1 : For program sorting in ATSS (High Impedance). Key-in. 7.
Front side / Back side. Software enhancement. COMPUTER AIDED TOOLS FOR FA : NAVIGATION / BITMAP ( full integrated ). Behavioral simulation / diagnostic.
... Stimulation / Soft defect localization. ⢠IR Thermography ... Non destructive analysis ... Region Of Interest ? - Can you still test your product after preparation ?
needle stage, the geometry of the original specimen is not a limiting factor for ... Figure 4 shows a schematic flow for the FIB micro-pillar sample preparation ...